By Yang Leng
This publication covers cutting-edge recommendations standard in smooth fabrics characterization. very important features of characterization, fabrics constructions and chemical research, are incorporated. usual options, corresponding to metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are defined. furthermore, the booklet introduces complex innovations, together with scanning probe microscopy. the second one 1/2 the publication hence offers strategies corresponding to X-ray power dispersive spectroscopy (commonly built within the scanning electron microscope), fluorescence X-ray spectroscopy, and renowned floor research ideas (XPS and SIMS). ultimately, vibrational spectroscopy (FTIR and Raman) and thermal research also are coated.
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In total, 80 sections of the pollen grain were imaged for 3D reconstruction. 1 µm. 47 shows 11 of 80 plane images and the reconstructed 3D image. Although its major applications are in biology, confocal microscopy can also be used for examining the surface topography and internal structure of semi-transparent materials. 48 shows an example of using confocal fluorescent microscopy to examine particulate penetration through an air filter made of polymer foam. The particulates were fluorescently labeled and their locations in the polymer foam are revealed against the polymer foam surfaces.
2001) Fundamentals of Light Microscopy and Electronic Imaging, Wiley-Liss. F. , New York. J. , John Wiley & Sons, New York. R. N. (2002) Microscopy Techniques for Materials Science, Woodhead Publishing Ltd, Cambridge UK. A. (1989) Applied Polymer Light Microscopy, Elsevier Applied Science, London. C. T. (1996) Polymer Microscopy, Chapman & Hall, London. American Society for Metals (1986) Metals Handbook, Volume 10, 9th edition, American Society for Metals, Metals Park. Scheirs, J. (2000) Compositional and Failure Analysis of Polymers: A Practical Approach, John Wiley & Sons, Ltd, Chichester.
This should not be difficult for low-index planes of cubic systems. For example, when (h2 + k2 + l2 ) is equal to 1, the plane index must be {001}; when it is equal to 2, the index must be {110}. This type of calculation is often not necessary 51 X-ray Diffraction Methods because the relationship between deflection angle and the Miller indices of most crystalline materials, for a given λ, have been determined and published by the International Centre for Diffraction Data. 3) are satisfied. Such diffraction spots of various crystallographic planes in a crystal form a three-dimensional array that is the reciprocal lattice of crystal.