By Gerhard Dehm, James M. Howe, Josef Zweck
Adopting a didactical process from basics to real experiments and functions, this instruction manual and prepared reference covers real-time observations utilizing smooth scanning electron microscopy and transmission electron microscopy, whereas additionally supplying info at the required phases and samples. The textual content starts off with introductory fabric and the fundamentals, earlier than describing developments and purposes in dynamic transmission electron microscopy and mirrored image electron microscopy. thus, the options had to confirm progress strategies, chemical reactions and oxidation, irradiation results, mechanical, magnetic, and ferroelectric homes in addition to cathodoluminiscence and electromigration are mentioned.
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Extra info for In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science
Example text
Consequently, processes which involve an energy transfer in the range of 5 to 50 eV dominate and, accordingly, the electrons lose their energy continuously in small quantities. 10 Schematic drawing of an energy diagram of a solid. Possible primary and secondary effects are indicated. Redrawn from Ref. [6]. j17 18 j 1 Introduction to Scanning Electron Microscopy electron can travel before being inelastically scattered, depends on the specific sample material and the incident electron energy, but typically is of the order of 100 nm.
Together with the information obtained by BSE or SE images, these provide valuable information for materials scientists and engineers. However, from the above discussion it should be clear that the X-ray signal stems from an interaction volume that is much larger than the electron beam size used for the data acquisition. 6 Other Signals As noted above, the interaction of the incident beam with an optically active material can lead to the emission of light. This cathodoluminescence (CL) can be detected by using a special detector that consists of a semi-ellipsoidal mirror for light collection and focusing, a light guide, and a photomultiplier.
1 Simplified schematic diagrams of the principles of TEM imaging and diffraction and STEM imaging in modern TEM/STEM instruments. (a) In TEM mode, the condenser lens system produces a parallel electron beam on the sample, the size of which is determined by the size of the condenser aperture. The transmitted (light gray) and scattered (darker gray levels) electron partial waves are then spatially separated in the back focal plane of the objective lens, where the objective aperture may be used to select specific reflections.